Paving the Way for Suitable Metasurfaces' Measurements under Oblique Incidence: Mono-/Bistatic and Near-/Far-Field Concerns

  1. Alvarez, H.F.
  2. Gomez, M.E.D.C.
  3. Las-Heras, F.
Aldizkaria:
IEEE Transactions on Instrumentation and Measurement

ISSN: 1557-9662,  0018-9456

Argitalpen urtea: 2020

Alea: 69

Zenbakia: 4

Orrialdeak: 1737-1744

Mota: Artikulua

DOI: 10.1109/TIM.2019.2913721 GOOGLE SCHOLAR
Datuen iturria: Scopus