Paving the Way for Suitable Metasurfaces' Measurements under Oblique Incidence: Mono-/Bistatic and Near-/Far-Field Concerns

  1. Alvarez, H.F.
  2. Gomez, M.E.D.C.
  3. Las-Heras, F.
Journal:
IEEE Transactions on Instrumentation and Measurement

ISSN: 1557-9662,  0018-9456

Year of publication: 2020

Volume: 69

Issue: 4

Pages: 1737-1744

Type: Article

DOI: 10.1109/TIM.2019.2913721 GOOGLE SCHOLAR
Data source: Scopus