Reduced order models for uncertainty management and zero-defect control in seal manufacturing

  1. Viejo Monge, Ismael
  2. Alcala Serrano, Noelia
  3. Izquierdo, Salvador
  4. Conde Vallejo, Ignacio
  5. Zambrano, Valentina
  6. Gracia Grijota, Leticia A.
Book Series:
2019 IEEE 17TH INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN)

ISSN: 1935-4576

ISBN: 978-1-7281-2927-3

Year of publication: 2019

Pages: 1627-1630

Congress: 17th IEEE International Conference on Industrial Informatics (INDIN)

Type: Conference paper

DOI: 10.1109/INDIN41052.2019.8972097 GOOGLE SCHOLAR

Sustainable development goals

Data source: WoS