Analysis of Skin Effect in Single Wire Resistance by Finite Element Methods
- Gonzalez-Teodoro, J.R.
- Kindl, V.
- Romero-Cadaval, E.
- Asensi, R.
Proceedings:
Proceedings - 2020 IEEE 14th International Conference on Compatibility, Power Electronics and Power Engineering, CPE-POWERENG 2020
ISBN: 9781728142180
Year of publication: 2020
Pages: 19-23
Type: Conference paper