Framework-supported mechanism of testing algorithms for assessing memory and detecting disorientation from IoT sensors
- Garcia-Magarino, I.
- Cardenas, M.
- Gomez-Sanz, J.
- Perez Diez, J.L.
Konferenzberichte:
IEEE 5th World Forum on Internet of Things, WF-IoT 2019 - Conference Proceedings
ISBN: 9781538649800
Datum der Publikation: 2019
Seiten: 899-904
Art: Konferenz-Beitrag